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1

Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing

Chih-Wen Lu, Chung Len Lee, Chauchin Su, Jwu-E Chen

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 96 KB

english, 2002

2

[IEEE 2013 IEEE International Symposium on Circuits and Systems (ISCAS) - Beijing (2013.5.19-2013.5.23)] 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013) - A UWB mixer with a balanced wide band active balun using crossing centertaped inductor

Xiangrong Zhang,, Xiaole Cui,, Bo Wang,, Chung Len Lee,

Year:

2013

Language:

english

File:

PDF, 545 KB

english, 2013

3

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Characteristics improvement and carrier transportation of CeO/sub 2/ gate dielectrics with rapid thermal annealing

Jer Chyi Wang,, Kuo Cheng Chiang,, Tan Fu Lei,, Chung Len Lee,

Year:

2004

Language:

english

File:

PDF, 264 KB

english, 2004

4

Suppression of the boron penetration induced Si/SiO/sub 2/ interface degradation by using a stacked-amorphous-silicon film as the gate structure for pMOSFET

Shye Lin Wu,, Chung Len Lee,, Tan Fu Lei,, Chen, J.F., Chen, L.J.

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 229 KB

english, 1994

5

Current multiplication in MIS structures

Chein Wei Jen, Chung Len Lee, Tan Fu Lei

Journal:

Solid-State Electronics

Year:

1984

Language:

english

File:

PDF, 825 KB

english, 1984

6

Contact resistivities of Al and Ti on Si measured by a self-aligned vertical Kelvin test resistor structure

Wen Luh Yang, Tan Fu Lei, Chung Len Lee

Journal:

Solid-State Electronics

Year:

1989

Language:

english

File:

PDF, 440 KB

english, 1989

7

High-resolution MOS magnetic sensor with thin oxide in standard submicron CMOS process

Hong-Ming Yang, Yu-Chung Huang, Lei Tan-Fu, Chung-Len Lee, Shu-Chi Chao

Journal:

Sensors and Actuators A: Physical

Year:

1996

Language:

english

File:

PDF, 408 KB

english, 1996

8

On-chip built-in jitter measurement circuit for PLL based on duty-cycle modulation vernier delay line

Yu, Fei, Lee, Chung Len, Zhang, Jingkai

Journal:

Tsinghua Science & Technology

Year:

2007

Language:

english

File:

PDF, 197 KB

english, 2007

9

The effects of H2-O2-plasma treatment on the characteristics of polysilicon thin-film transistors

Horng Nan Chern, Chung Len Lee, Tan Fu Lei

Journal:

IEEE Transactions on Electron Devices

Year:

1993

Language:

english

File:

PDF, 612 KB

english, 1993

10

Nitridization of the stacked poly-Si gate to suppress the boron penetration in pMOS

Yung Hao Lin, Chao Sung Lai, Chung Len Lee, Tan Fu Lei, Tien Sheng Chao

Journal:

IEEE Transactions on Electron Devices

Year:

1996

Language:

english

File:

PDF, 607 KB

english, 1996

11

Argon ion-implantation on polysilicon or amorphous-silicon for boron penetration suppression in p+ pMOSFET

Lurng Shehng Lee, Chung Len Lee

Journal:

IEEE Transactions on Electron Devices

Year:

1998

Language:

english

File:

PDF, 316 KB

english, 1998

12

High reliability polyoxide fabricated by using TEOS oxide deposited on disilane polysilicon film

Jam Wem Lee, Chung-Len Lee, Tan Fu Lei, Chao Sung Lai

Journal:

IEEE Transactions on Electron Devices

Year:

2001

Language:

english

File:

PDF, 179 KB

english, 2001

13

Specific contact resistivity measurement by a vertical Kelvin test structure

Tan Fu Lei, Len-Yi Leu, Chung Len Lee

Journal:

IEEE Transactions on Electron Devices

Year:

1987

Language:

english

File:

PDF, 705 KB

english, 1987

14

[IEEE 2013 IEEE International Wireless Symposium (IWS) - Beijing, China (2013.04.14-2013.04.18)] 2013 IEEE International Wireless Symposium (IWS) - A high gain, wide band (2–10 GHz), and low noise active balun merged folded mixer for the full-band UWB application

Zhang, Xiangrong, Cui, Xiaole, Wang, Bo, Lee, Chung Len

Year:

2013

Language:

english

File:

PDF, 230 KB

english, 2013

15

Thin polyoxide on the top of poly-Si gate to suppress boron penetration for pMOS

Yung Hao Lin,, Chung Len Lee,, Tan Fu Lei,, Tien Sheng Chao,

Journal:

IEEE Electron Device Letters

Year:

1995

Language:

english

File:

PDF, 211 KB

english, 1995

16

Thin tunnel oxide grown on silicon substrate pretreated by CF4 plasma

Jam Wem Lee,, Tan Fu Lei,, Chung-Len Lee,

Journal:

IEEE Electron Device Letters

Year:

2001

Language:

english

File:

PDF, 57 KB

english, 2001

17

H/sub 2//O/sub 2/ plasma on polysilicon thin-film transistor

Horng Nan Chern,, Chung Len Lee,, Tan Fu Lei,

Journal:

IEEE Electron Device Letters

Year:

1993

Language:

english

File:

PDF, 263 KB

english, 1993

18

[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - A reconfigurable MAC architecture implemented with mixed-Vt standard cell library

Li-Rong Wang,, Yi-Wei Chiu,, Chia-Lin Hu,, Ming-Hsien Tu,, Shyh-Jye Jou,, Chung-Len Lee,

Year:

2008

Language:

english

File:

PDF, 240 KB

english, 2008

19

[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - A Fast Two-Stage Sample-and-Hold Amplifier for Pipelined ADC Application

Ruan, Jian, Lee, Chung Len

Year:

2008

Language:

english

File:

PDF, 561 KB

english, 2008

20

[IEEE 9th International Vacuum Microelectronics Conference - St. Petersburg, Russia (7-12 July 1996)] 9th International Vacuum Microelectronics Conference - A SPICE simulation model for field emission triode

Chih-Wen Lu,, Chung Len Lee,, Huang, J.M.

Year:

1996

Language:

english

File:

PDF, 140 KB

english, 1996

21

Depletion widths of the metal-insulator semiconductor (MIS) structure

Chein Wei Jen, Chung Len Lee, Tan Fu Lei

Journal:

Solid-State Electronics

Year:

1981

Language:

english

File:

PDF, 484 KB

english, 1981

22

A polysilicon-on-oxide (POSOX) isolation structure for bipolar integrated circuits

Chung-Len Lee, Tan Fu Lei, Neng-Wei Wu, Rey-Bin Tang

Journal:

Solid-State Electronics

Year:

1987

Language:

english

File:

PDF, 598 KB

english, 1987

23

Ellipsometry measurements on SiO2 films for thicknesses under 200Å

Jau Hwang Ho, Chung Len Lee, Chein Wei Jen, Tan Fu Lei

Journal:

Solid-State Electronics

Year:

1987

Language:

english

File:

PDF, 716 KB

english, 1987

24

Switching characteristics of MINPN devices

David C.Y. Chang, Chung Len Lee, Tan Fu Lei

Journal:

Solid-State Electronics

Year:

1989

Language:

english

File:

PDF, 795 KB

english, 1989

25

Numerical simulation of the vertical Kelvin test structure for specific contact resistivity

Len-Yi Leu, Chung Len Lee, Tan Fu Lei, Wen Luh Yang

Journal:

Solid-State Electronics

Year:

1990

Language:

english

File:

PDF, 958 KB

english, 1990

26

A study of the interfacial layer of Al and Al(1% Si)Si contacts using a zero-layer ellipsometry model

Tien Sheng Chao, Chung Len Lee, Tan Fu Lei

Journal:

Solid-State Electronics

Year:

1992

Language:

english

File:

PDF, 516 KB

english, 1992

27

Thin oxide grown on heavily channel-implanted substrate by using a low temperature wafer loading and N2 pre-annealing process

Shye Lin Wu, Chung Len Lee, Tan Fu Lei

Journal:

Solid-State Electronics

Year:

1993

Language:

english

File:

PDF, 602 KB

english, 1993

28

Characteristics of high breakdown voltage Schottky barrier diodes using p+-polycrystalline-silicon diffused-guard-ring

Bor Wen Liou, Chung Len Lee

Journal:

Solid-State Electronics

Year:

2000

Language:

english

File:

PDF, 540 KB

english, 2000

29

Plasma effects of fluorine implantation on As+-doped polycrystalline silicon thin films of various thicknesses

Bor Wen Liou, Chung Len Lee

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 286 KB

english, 2000

30

Checkpoints in irredundant two-level combinational circuits

Jwu E. Chen, Chung Len Lee, Wen Zen Shen

Journal:

Journal of Electronic Testing

Year:

1991

Language:

english

File:

PDF, 165 KB

english, 1991

31

MT-SIM a mixed-level transition fault simulator based on parallel patterns

Chung Len Lee, Ching Ping Wu, Wen Zen Shen, Tyh Song Hwang, Shueng Dar Hwang

Journal:

Journal of Electronic Testing

Year:

1992

Language:

english

File:

PDF, 841 KB

english, 1992

32

Universal test set generation for CMOS circuits

Beyin Chen, Chung Len Lee

Journal:

Journal of Electronic Testing

Year:

1995

Language:

english

File:

PDF, 883 KB

english, 1995

33

IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection

Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E Chen

Journal:

Journal of Electronic Testing

Year:

2007

Language:

english

File:

PDF, 880 KB

english, 2007

34

Error reduction in the ellipsometric measurement on thin films

Jau Hwang Ho, Chung Len Lee, Tan Fu Lei

Journal:

Solid-State Electronics

Year:

1988

Language:

english

File:

PDF, 577 KB

english, 1988

35

On-chip multi-giga bit cycle-to-cycle jitter measurement circuit

Zhang, Jingkai, Lee, Chung Len, Tian, Chao, Yu, Fei

Journal:

Tsinghua Science & Technology

Year:

2007

Language:

english

File:

PDF, 330 KB

english, 2007

36

Oscillation Ring Delay Test for High Performance Microprocessors

Wen Ching Wu, Chung Len Lee, Ming Shae Wu, Jwu E. Chen, Magdy S. Abadir

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 115 KB

english, 2000

37

Fault Diagnosis for Linear Analog Circuits

Jun Weir Lin, Chung Len Lee, Chau Chin Su, Jwu-E. Chen

Journal:

Journal of Electronic Testing

Year:

2001

Language:

english

File:

PDF, 485 KB

english, 2001

38

Structural Fault Based Specification Reduction for Testing Analog Circuits

Soon-Jyh Chang, Chung Len Lee, Jwu E. Chen

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 353 KB

english, 2002

39

Pd-Ge contact to n-GaAs with the TiW diffusion barrier

Wen Chang Huang, Tan Fu Lei, Chung Len Lee

Journal:

Journal of Electronic Materials

Year:

1994

Language:

english

File:

PDF, 727 KB

english, 1994

40

HIF overexpression correlates with biallelic loss of fumarate hydratase in renal cancer: Novel role of fumarate in regulation of HIF stability

Jennifer S. Isaacs, Yun Jin Jung, David R. Mole, Sunmin Lee, Carlos Torres-Cabala, Yuen-Li Chung, Maria Merino, Jane Trepel, Berton Zbar, Jorge Toro, Peter J. Ratcliffe, W. Marston Linehan, Len Necker

Journal:

Year:

2005

Language:

english

File:

PDF, 569 KB

english, 2005

41

Simulatable timing model for MOS logic circuit

Shyh-Jye Jou,, Wen-Zen Shen,, Chein-Wei Jen,, Chung-Len Lee,

Journal:

IEE Proceedings G (Electronic Circuits and Systems)

Year:

1987

Language:

english

File:

PDF, 1.01 MB

english, 1987

42

Correlation of polysilicon thin-film transistor characteristics to defect states via thermal annealing

Horng Nan Chern, Chung Len Lee, Tan Fu Lei

Journal:

IEEE Transactions on Electron Devices

Year:

1994

Language:

english

File:

PDF, 307 KB

english, 1994

43

The effects of fluorine passivation on polysilicon thin-film transistors

Horng Nan Chern, Chung Len Lee, Tan Fu Lei

Journal:

IEEE Transactions on Electron Devices

Year:

1994

Language:

english

File:

PDF, 498 KB

english, 1994

44

An analytical model for the above-threshold characteristics of polysilicon thin-film transistors

Horng Nan Chern, Chung Len Lee, Tan Fu Lei

Journal:

IEEE Transactions on Electron Devices

Year:

1995

Language:

english

File:

PDF, 635 KB

english, 1995

45

Characteristics of top-gate thin-film transistors fabricated on nitrogen-implanted polysilicon films

Chien Kuo Yang, Tan Fu Lei, Chung Len Lee

Journal:

IEEE Transactions on Electron Devices

Year:

1995

Language:

english

File:

PDF, 686 KB

english, 1995

46

Characterization of thin textured tunnel oxide prepared by thermal oxidation of thin polysilicon film on silicon

Shye Lin Wu, De Ming Chiao, Chung Len Lee, Tan Fu Lei

Journal:

IEEE Transactions on Electron Devices

Year:

1996

Language:

english

File:

PDF, 1015 KB

english, 1996

47

Suppression of the boron penetration induced dielectric degradation by using a stacked-amorphous-silicon film as the gate structure for pMOSFET

Shye Lin Wu, Chung Len Lee, Tan Fu Lei

Journal:

IEEE Transactions on Electron Devices

Year:

1996

Language:

english

File:

PDF, 849 KB

english, 1996

48

The characteristics of polysilicon oxide grown in pure N2O

Chao Sung Lai, Tan Fu Lei, Chung Len Lee

Journal:

IEEE Transactions on Electron Devices

Year:

1996

Language:

english

File:

PDF, 795 KB

english, 1996

49

Polyoxides grown on n+ polysilicon

Shye Lin Wu, Chun Yuan Chen, Ta Yow Lin, Chung Len Lee, Tan Fu Lei, Mong Song Liang

Journal:

IEEE Transactions on Electron Devices

Year:

1997

Language:

english

File:

PDF, 235 KB

english, 1997

50

Monitoring trapped charge generation for gate oxide under stress [MOS capacitors]

Yung Hao Lin, Chung Len Lee, Tan Fu Lei

Journal:

IEEE Transactions on Electron Devices

Year:

1997

Language:

english

File:

PDF, 246 KB

english, 1997

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